Electronic devices based on the 2D material black phosphorous - layer-dependent properties

DFG project 454726051

Involved Scientists

Dr. Andreas Hutzler
Julian Schwarz, M.Sc. (Staff Scientist at FAU Electron Devices)
Dr. Mathias Rommel (Group Leader at FhG IISB)
Prof. Dr. Vojislav Krstić (Professorship in Applied Physics at FAU Chair of Applied Physics)
Dr. Maria Kolesnik-Gray (PostDoc at FAU Chair of Applied Physics)

Related Publications

2025

J. Schwarz, J. Dick, S. Beuer, M. Rommel, A. Hutzler, Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy, Micron 198, 2025, Art. No. 103878, DOI: 10.1016/j.micron.2025.103878

J. Schwarz, M. Niebauer (equal contribution), L. Römling, A. Pham, M. Kolesnik-Gray, P. Evanschitzky, N. Vogel, V. Krstic, M. Rommel, A. Hutzler, Spectro-Spatial Demixing in Optical Microspectroscopy for Thickness Determination of Layered Materials, Advanced Optical Materials 13 (5), 2025, Art. No. 2402502, DOI: 10.1002/adom.202402502

2023

J. Schwarz, M. Niebauer (equal contribution), M. Kolesnik-Gray, M. Szabo, P. Chava, L. Baier, J. Schulze, A. Erbe, V. Krstic, M. Rommel, A. Hutzler, Correlating 4x4 Transfer Matrix Modeling with Optical Microspectroscopy for Layer Counting of Anisotropic 2D Materials, Small Methods 7 (10), 2023, Art. No. 2300618, DOI: 10.1002/smtd.202300618

M. Koleśnik-Gray, L. Meingast, M. Siebert, T. Unbehaun, T. Huf, G. Ellrott, G. Abellan-Saez, S.Wild, V. Lloret, U. Mundloch, J. Schwarz, M. Niebauer, M. Szabo, M. Rommel, A. Hutzler, F. Hauke, A. Hirsch, V. Krstić, Unconventional conductivity increase in multilayer black phosphorus, npj 2D Materials and Applications 7, 2023, Art. No. 21, DOI: 10.1038/s41699-023-00384-2

2020

A. Hutzler, B. Fritsch, C. M. Matthus, M. P. M. Jank, M. Rommel, Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy, Scientific Reports 10, 2020, Art. No. 13676, DOI: 10.1038/s41598-020-70580-3

2019

A. Hutzler, C. D. Matthus, C. Dolle, M. Rommel, M. P. M. Jank, E. Spiecker, L. Frey, Large-Area Layer Counting of Two-Dimensional Materials Evaluating the Wavelength Shift in Visible-Reflectance Spectroscopy, Journal of Physical Chemistry C 123 (14), 2019, pp. 9192 - 9201, DOI: 10.1021/acs.jpcc.9b00957

2017

A. Hutzler, C. D. Matthus (equal contribution), M. Rommel, L. Frey, Generalized approach to design multi-layer stacks for enhanced optical detectability of ultrathin layers, Applied Physics Letters 110 (2), 2017, Art. No. 021909, DOI: 10.1063/1.4973968

Last Modified: 08.08.2025