Elektronische Bauelemente auf Basis des 2D-Materials schwarzer Phosphor - lagenanzahlabhängige Eigenschaften

DFG Projekt 454726051

Beteiligte Wissenschaftlerinnen und Wissenschaftler

Dr. Andreas Hutzler
Julian Schwarz, M.Sc. (Wissenschaftlicher Mitarbeiter bei FAU Electron Devices)
Dr. Mathias Rommel (Gruppenleiter am FhG IISB)
Prof. Dr. Vojislav Krstić (Professur für Angewandte Physik am FAU-Lehrstuhl für Angewandte Physik)
Dr. Maria Kolesnik-Gray (PostDoc am FAU-Lehrstuhl für Angewandte Physik)

Verwandte Publikationen

2025

J. Schwarz, J. Dick, S. Beuer, M. Rommel, A. Hutzler, Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy, Micron 198, 2025, Art. No. 103878, DOI: 10.1016/j.micron.2025.103878

J. Schwarz, M. Niebauer (equal contribution), L. Römling, A. Pham, M. Kolesnik-Gray, P. Evanschitzky, N. Vogel, V. Krstic, M. Rommel, A. Hutzler, Spectro-Spatial Demixing in Optical Microspectroscopy for Thickness Determination of Layered Materials, Advanced Optical Materials 13 (5), 2025, Art. No. 2402502, DOI: 10.1002/adom.202402502

2023

J. Schwarz, M. Niebauer (equal contribution), M. Kolesnik-Gray, M. Szabo, P. Chava, L. Baier, J. Schulze, A. Erbe, V. Krstic, M. Rommel, A. Hutzler, Correlating 4x4 Transfer Matrix Modeling with Optical Microspectroscopy for Layer Counting of Anisotropic 2D Materials, Small Methods 7 (10), 2023, Art. No. 2300618, DOI: 10.1002/smtd.202300618

M. Koleśnik-Gray, L. Meingast, M. Siebert, T. Unbehaun, T. Huf, G. Ellrott, G. Abellan-Saez, S.Wild, V. Lloret, U. Mundloch, J. Schwarz, M. Niebauer, M. Szabo, M. Rommel, A. Hutzler, F. Hauke, A. Hirsch, V. Krstić, Unconventional conductivity increase in multilayer black phosphorus, npj 2D Materials and Applications 7, 2023, Art. No. 21, DOI: 10.1038/s41699-023-00384-2

2020

A. Hutzler, B. Fritsch, C. M. Matthus, M. P. M. Jank, M. Rommel, Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy, Scientific Reports 10, 2020, Art. No. 13676, DOI: 10.1038/s41598-020-70580-3

2019

A. Hutzler, C. D. Matthus, C. Dolle, M. Rommel, M. P. M. Jank, E. Spiecker, L. Frey, Large-Area Layer Counting of Two-Dimensional Materials Evaluating the Wavelength Shift in Visible-Reflectance Spectroscopy, Journal of Physical Chemistry C 123 (14), 2019, pp. 9192 - 9201, DOI: 10.1021/acs.jpcc.9b00957

2017

A. Hutzler, C. D. Matthus (equal contribution), M. Rommel, L. Frey, Generalized approach to design multi-layer stacks for enhanced optical detectability of ultrathin layers, Applied Physics Letters 110 (2), 2017, Art. No. 021909, DOI: 10.1063/1.4973968

Letzte Änderung: 08.08.2025